Microscopy is a discipline that has diverse uses in the biomedical sciences, industry and the academic community. Micro-Optical Methods provides services designed to meet the needs of both the instrument and the user that they may work efficiently together.
Micro-Optical Methods provides an optical refurbishment service that includes cleaning, repair and alignment of microscopes, their imaging systems and ancillary equipment. Depending upon the nature of the work to be done, reconditioning can be accomplished on the premises or in our shop. All repairs are warranted. There is no charge to troubleshoot and evaluate a microscope's condition. Quotes provided will include any necessary parts and/or accessories to bring the instrument back to its proper capabilities.
Microscope Maintenance Protocols:
General Scope of Work
Electrical
Plugs/Wires/fuses: Check integrity
Sockets/Switches: Check contacts
Transformers: Check function & secondary voltage output, if needed
Bulbs: Clean glass, if needed & check contacts
Meters: Check function
Rheostats: Check output uniformity
Illuminators
Filters: Clean & check for defects
Field Lenses: Clean
Field Diaphragm: Check uniformity of movement of aperture & centration
Alignment Adjustments: Align and lubricate, if needed
Base
Mirrors: Clean (second surface), blow off dust (first surface)
Filters: Clean
Exit pupil: Clean
Arm
Coarse Focus: Check uniformity of movement & safety stop
Fine Focus: Check uniformity of movement
Mechanical Stage: Check uniformity & lubricate if needed
Nosepiece: Check uniformity of movement & detents
Objectives: Clean & check for surface irregularities, lens delamination or liquid intrusion
Condenser
Lenses: Clean
Filters: Clean & check for defects
Diaphragms: Check uniformity of movement of aperture & centration in objective's back focal plane
Movements: Check uniformity and lubricate if needed
Body Tube Sliders Clean lenses, clean and/or blow off prisms/mirrors, clean filters
Head (monoc, binoc, trinoc, dual, multi, or other): Clean all readily accessible optical surfaces
Oculars: Clean outer surfaces (inner surfaces, if necessary, check for surface irregularities and lens delamination)
Ancillary systems: Drawing, clean optical surfaces; Photo/digital, clean optical surfaces, inspect camera backs, sensors & detectors
Fluorescence Microscope Preventive Maintenance
1) Mercury burner is removed & the condition of the anode & cathode are inspected for excessive pitting & terminal separation
2) Burner is replaced & tightened securely
3) Di-chroic beam splitter cube modules are removed and inspected for delaminations and other defects
4) Band pass for exciters & barriers are verified
5) Burner warm-up is observed to inspect terminal point-to-point plasma arc wander and stabilization
6) Alignment of epi-fluorescence system is performed with the cube assembly detent positions verified
7) Beam spread and emission functions are tested for each filter combination using specimen slide standards
Polarizing Microscope Preventive Maintenance
1) Both polarizer and analyzer are removed to inspect for delaminations and depolymerizations
2) "In-mount" extinction alignments and their amplitudes are verified and realigned if needed
3) Upon replacement in the instrument, troubleshooting of the complete optical train is performed to observe and mitigate depolarization caused by stressed optical components in the polarizing beam path
4) Koehler illumination is put in place
5) Polarizing extinction angles and efficiency are tested using both ocular reticles and specimen standards
6) If a circular stage is used, detents are tested to coincide with extinction positions and verniers
7) A first order magenta-tint compensator is used to verify gout and pseudogout crystal identification and selected mineral standards
8) Both central stop and central aperture dispersion staining objectives are aligned with aperture and field irises
9) Dispersion staining images are compared with and without the condenser's auxiliary lens.
10) Specimen controls are used to confirm dispersion colors with refractive index standards against the dispersion staining nomograms.
11) The Bertrand lens is put into place throughout these procedures to establish proper conoscopic capabilities such as accessory alignments, extinction coefficients and interference figure viewing.
Multiple Head Microscope Preventive Maintenance
1) Dual headed and teaching arm modules are disassembled to inspect stresses at attachment points and wear of detents
2) The condition of the optics in both the transfer arms and ancillary binocular heads is inspected
3) Once secured in place, the cantilever stability is tested
4) Koehler illumination is put in place
5) Optical alignment throughout the whole beam path to the satellite binocular heads is performed
6) Parfocalization of all objective/ocular combinations is performed using specimen slide standards
7) Pointer systems, if present, are aligned with illuminator and sweep along field-of-view is tested
Inverted and Reflected Light Microscope Preventive Maintenance
(These instruments are maintained as per the "general scope of work" described previously)
Particular attention is paid to the inverted microscopes' upward facing objective lens surfaces, as each objective's front surfaces are more readily susceptible to damage than an upright microscope's objectives. Each objective is removed and individually inspected through its back aperture with a special multi-surface viewing (MSV) telescope that will clearly detect surface artifacts, coating defects, liquid intrusions and internal delaminations via reflected light optical sectioning.
This MSV telescope is used to great benefit in observing an inverted system's internal optical surfaces such as first-surface mirrors, beam-splitters, telan lenses and guard plates. If any of these optics have deposits or defects, the instrument is disassembled to access these areas. Sealant may be applied around objective mounts to prevent liquid intrusion.
Auxiliary Device Preventive Maintenance
These auxiliary systems such as UV, IR, photo-detectors, CMOS and CCD chips are inspected and properly maintained as needed. Their resulting images are checked on monitors using incoherent and relatively coherent illumination to locate artifacts in the proximity of any imaging conjugate planes. Disassembly of various components is accomplished to eliminate these artifacts.
Microscope Contrast Enhancement Preventive Maintenance Procedures
1) Brightfield: Incoherent and relatively coherent (axial) illumination is tested for contrast changes to the diffraction threshold and off-axis misalignments using specimen standards.
2) Darkfield: Annuli are aligned and its efficiency is confirmed through the observation of the captured near-field, back focal plane diffraction orders coincident with the objective's numerical aperture in use.
3) Oblique Illumination : This is tested by manipulating the non-imaging conjugate planes with various aperture iris settings for those microscopes capable of doing this procedure.
4) Modulation Contrast: Using the various manufacturers' interpretations, this is tested with both axial and off-axis slit arrangements. Condenser-objective conjugate slit apertures are aligned as required. The filament or plasma arc is aligned with relation to these conjugate slit apertures. The lower "port" polarizer is tested for extinction efficiency and alignment with the condenser's front focal plane slit polarizer.
5) Differential Interference Contrast (DIC): The DIC polarizer and analyzer extinction efficiency is checked and aligned as required. The "Nomarski-Wollaston" beam-splitter image separations are correlated with the proper objective numerical aperture. The zero-order fringe displacement and spread is manipulated and azimuth orientation is affirmed or corrected as needed. The specimen's rate-of-change of slope contrast is tested via the uniformity of the upper beam splitter's linear traverse with the incremental detents and smooth rotation of the condenser's turret. Isotropic specimens are used to obtain proper contrast changes with DIC.
6) Phase Contrast: The resolution of thin, non-slope, point-to-point differences in specimen detail involves the proper alignment of the condenser's front focal plane illumination annuli with each of the proper objective's conjugate back focal plane's advance or phase retarding annuli. Smooth movement of both the condenser turret's rotation and annuli centration are tested and corrected if required. The filament is aligned and magnified, so as to completely cover each of the condenser's annular diaphragms.
If a Walton-Beckett reticle is employed, its area is measured and affirmed to be used in mineral fiber analysis. A metric stage micrometer is used in this procedure. A standardized resolution test is also confirmed using the current HSE phase contrast resolution test slide with the 40X/.065 N.A. phase objective.
Micro-Optical Methods provides an optical refurbishment service that includes cleaning, repair and alignment of microscopes, their imaging systems and ancillary equipment. Depending upon the nature of the work to be done, reconditioning can be accomplished on the premises or in our shop. All repairs are warranted. There is no charge to troubleshoot and evaluate a microscope's condition. Quotes provided will include any necessary parts and/or accessories to bring the instrument back to its proper capabilities.
Microscope Maintenance Protocols:
General Scope of Work
Electrical
Plugs/Wires/fuses: Check integrity
Sockets/Switches: Check contacts
Transformers: Check function & secondary voltage output, if needed
Bulbs: Clean glass, if needed & check contacts
Meters: Check function
Rheostats: Check output uniformity
Illuminators
Filters: Clean & check for defects
Field Lenses: Clean
Field Diaphragm: Check uniformity of movement of aperture & centration
Alignment Adjustments: Align and lubricate, if needed
Base
Mirrors: Clean (second surface), blow off dust (first surface)
Filters: Clean
Exit pupil: Clean
Arm
Coarse Focus: Check uniformity of movement & safety stop
Fine Focus: Check uniformity of movement
Mechanical Stage: Check uniformity & lubricate if needed
Nosepiece: Check uniformity of movement & detents
Objectives: Clean & check for surface irregularities, lens delamination or liquid intrusion
Condenser
Lenses: Clean
Filters: Clean & check for defects
Diaphragms: Check uniformity of movement of aperture & centration in objective's back focal plane
Movements: Check uniformity and lubricate if needed
Body Tube Sliders Clean lenses, clean and/or blow off prisms/mirrors, clean filters
Head (monoc, binoc, trinoc, dual, multi, or other): Clean all readily accessible optical surfaces
Oculars: Clean outer surfaces (inner surfaces, if necessary, check for surface irregularities and lens delamination)
Ancillary systems: Drawing, clean optical surfaces; Photo/digital, clean optical surfaces, inspect camera backs, sensors & detectors
Fluorescence Microscope Preventive Maintenance
1) Mercury burner is removed & the condition of the anode & cathode are inspected for excessive pitting & terminal separation
2) Burner is replaced & tightened securely
3) Di-chroic beam splitter cube modules are removed and inspected for delaminations and other defects
4) Band pass for exciters & barriers are verified
5) Burner warm-up is observed to inspect terminal point-to-point plasma arc wander and stabilization
6) Alignment of epi-fluorescence system is performed with the cube assembly detent positions verified
7) Beam spread and emission functions are tested for each filter combination using specimen slide standards
Polarizing Microscope Preventive Maintenance
1) Both polarizer and analyzer are removed to inspect for delaminations and depolymerizations
2) "In-mount" extinction alignments and their amplitudes are verified and realigned if needed
3) Upon replacement in the instrument, troubleshooting of the complete optical train is performed to observe and mitigate depolarization caused by stressed optical components in the polarizing beam path
4) Koehler illumination is put in place
5) Polarizing extinction angles and efficiency are tested using both ocular reticles and specimen standards
6) If a circular stage is used, detents are tested to coincide with extinction positions and verniers
7) A first order magenta-tint compensator is used to verify gout and pseudogout crystal identification and selected mineral standards
8) Both central stop and central aperture dispersion staining objectives are aligned with aperture and field irises
9) Dispersion staining images are compared with and without the condenser's auxiliary lens.
10) Specimen controls are used to confirm dispersion colors with refractive index standards against the dispersion staining nomograms.
11) The Bertrand lens is put into place throughout these procedures to establish proper conoscopic capabilities such as accessory alignments, extinction coefficients and interference figure viewing.
Multiple Head Microscope Preventive Maintenance
1) Dual headed and teaching arm modules are disassembled to inspect stresses at attachment points and wear of detents
2) The condition of the optics in both the transfer arms and ancillary binocular heads is inspected
3) Once secured in place, the cantilever stability is tested
4) Koehler illumination is put in place
5) Optical alignment throughout the whole beam path to the satellite binocular heads is performed
6) Parfocalization of all objective/ocular combinations is performed using specimen slide standards
7) Pointer systems, if present, are aligned with illuminator and sweep along field-of-view is tested
Inverted and Reflected Light Microscope Preventive Maintenance
(These instruments are maintained as per the "general scope of work" described previously)
Particular attention is paid to the inverted microscopes' upward facing objective lens surfaces, as each objective's front surfaces are more readily susceptible to damage than an upright microscope's objectives. Each objective is removed and individually inspected through its back aperture with a special multi-surface viewing (MSV) telescope that will clearly detect surface artifacts, coating defects, liquid intrusions and internal delaminations via reflected light optical sectioning.
This MSV telescope is used to great benefit in observing an inverted system's internal optical surfaces such as first-surface mirrors, beam-splitters, telan lenses and guard plates. If any of these optics have deposits or defects, the instrument is disassembled to access these areas. Sealant may be applied around objective mounts to prevent liquid intrusion.
Auxiliary Device Preventive Maintenance
These auxiliary systems such as UV, IR, photo-detectors, CMOS and CCD chips are inspected and properly maintained as needed. Their resulting images are checked on monitors using incoherent and relatively coherent illumination to locate artifacts in the proximity of any imaging conjugate planes. Disassembly of various components is accomplished to eliminate these artifacts.
Microscope Contrast Enhancement Preventive Maintenance Procedures
1) Brightfield: Incoherent and relatively coherent (axial) illumination is tested for contrast changes to the diffraction threshold and off-axis misalignments using specimen standards.
2) Darkfield: Annuli are aligned and its efficiency is confirmed through the observation of the captured near-field, back focal plane diffraction orders coincident with the objective's numerical aperture in use.
3) Oblique Illumination : This is tested by manipulating the non-imaging conjugate planes with various aperture iris settings for those microscopes capable of doing this procedure.
4) Modulation Contrast: Using the various manufacturers' interpretations, this is tested with both axial and off-axis slit arrangements. Condenser-objective conjugate slit apertures are aligned as required. The filament or plasma arc is aligned with relation to these conjugate slit apertures. The lower "port" polarizer is tested for extinction efficiency and alignment with the condenser's front focal plane slit polarizer.
5) Differential Interference Contrast (DIC): The DIC polarizer and analyzer extinction efficiency is checked and aligned as required. The "Nomarski-Wollaston" beam-splitter image separations are correlated with the proper objective numerical aperture. The zero-order fringe displacement and spread is manipulated and azimuth orientation is affirmed or corrected as needed. The specimen's rate-of-change of slope contrast is tested via the uniformity of the upper beam splitter's linear traverse with the incremental detents and smooth rotation of the condenser's turret. Isotropic specimens are used to obtain proper contrast changes with DIC.
6) Phase Contrast: The resolution of thin, non-slope, point-to-point differences in specimen detail involves the proper alignment of the condenser's front focal plane illumination annuli with each of the proper objective's conjugate back focal plane's advance or phase retarding annuli. Smooth movement of both the condenser turret's rotation and annuli centration are tested and corrected if required. The filament is aligned and magnified, so as to completely cover each of the condenser's annular diaphragms.
If a Walton-Beckett reticle is employed, its area is measured and affirmed to be used in mineral fiber analysis. A metric stage micrometer is used in this procedure. A standardized resolution test is also confirmed using the current HSE phase contrast resolution test slide with the 40X/.065 N.A. phase objective.
